Mgbochi nke ịgbasa mmejọ na 4H-SiC PiN diodes site na iji ntinye proton iji kpochapụ mmebi bipolar.

Daalụ maka ileta Nature.com. Ụdị ihe nchọgharị ị na-eji nwere nkwado CSS nwere oke. Maka ahụmịhe kachasị mma, anyị na-akwado ka ị jiri ihe nchọgharị emelitere (ma ọ bụ gbanyụọ ọnọdụ ndakọrịta na Internet Explorer). Ka ọ dị ugbu a, iji hụ na nkwado na-aga n'ihu, anyị ga-enye saịtị ahụ na-enweghị ụdị na Javascript.
Ejirila 4H-SiC azụmaahịa dị ka ihe maka ngwaọrụ semiconductor ike. Otú ọ dị, ntụkwasị obi ogologo oge nke ngwaọrụ 4H-SiC bụ ihe mgbochi na ngwa ha sara mbara, na nsogbu ntụkwasị obi kachasị mkpa nke ngwaọrụ 4H-SiC bụ mmebi bipolar. Ihe kpatara mmebi a bụ otu mmejọ Shockley stacking (1SSF) mgbasa nke ụgbọ elu basal na kristal 4H-SiC. N'ebe a, anyị na-atụ aro usoro maka ịkwụsị mgbasawanye 1SSF site na ịkụnye protons na 4H-SiC epitaxial wafers. PiN diodes arụpụtara na wafers nwere ntinye proton gosipụtara otu njirimara voltaji dị ugbu a dị ka diode na-enweghị ntinye proton. N'ụzọ dị iche, a na-egbochi mgbasawanye 1SSF nke ọma na piN diode etinyere na proton. Ya mere, ntinye nke protons n'ime 4H-SiC epitaxial wafers bụ ụzọ dị irè maka igbochi mmebi bipolar nke 4H-SiC ike semiconductor ngwaọrụ mgbe ị na-arụ ọrụ ngwaọrụ. Nsonaazụ a na-enye aka na mmepe nke ngwaọrụ 4H-SiC nke a pụrụ ịdabere na ya nke ukwuu.
A na-amata silicon carbide (SiC) dị ka ihe semiconductor maka ngwaọrụ semiconductor dị elu, nke nwere ike ịrụ ọrụ na gburugburu ebe siri ike1. Enwere ọtụtụ SiC polytypes, n'ime nke 4H-SiC nwere ọmarịcha ngwaọrụ semiconductor akụrụngwa anụ ahụ dị ka ngagharị eletrọn dị elu yana mgbawa ọkụ eletrik2. 4H-SiC wafers na dayameta nke 6 sentimita na-ere ahịa ugbu a ma jiri ya mee ihe maka mmepụta nke ngwaọrụ semiconductor ike3. Ejiri ngwaọrụ semiconductor ike 4H-SiC4.5 mepụta sistemu traction maka ụgbọ ala eletrik na ụgbọ oloko. Otú ọ dị, ngwaọrụ 4H-SiC ka na-ata ahụhụ site na nsogbu ndị a pụrụ ịdabere na ya dị ogologo oge dịka nkwụsịtụ dielectric ma ọ bụ ntụkwasị obi dị mkpirikpi, 6,7 nke otu n'ime ihe ndị kasị mkpa a pụrụ ịdabere na ya bụ bipolar degenradation2,8,9,10,11. Achọpụtara mmebi bipolar a ihe karịrị afọ 20 gara aga ma bụrụkwa nsogbu ogologo oge na nrụpụta ngwaọrụ SiC.
A na-akpata mmebi bipolar site na otu ntụpọ Shockley stack (1SSF) na kristal 4H-SiC nwere mgbapụ ụgbọ elu basal (BPDs) na-agbasa site na recombination enhanced dislocation glide (REDG) 12,13,14,15,16,17,18,19. Ya mere, ọ bụrụ na-ebelata mgbasawanye BPD na 1SSF, enwere ike ịmepụta ngwaọrụ ike 4H-SiC na-enweghị mmebi bipolar. A kọwo ọtụtụ ụzọ iji gbochie mgbasa ozi BPD, dị ka mgbanwe BPD na Thread Edge Dislocation (TED) 20,21,22,23,24. N'ime ihe ọhụrụ SiC epitaxial wafers, BPD na-abụkarị na mkpụrụ osisi ọ bụghị na oyi akwa epitaxial n'ihi ntụgharị nke BPD na TED n'oge mmalite nke uto epitaxial. Ya mere, nsogbu fọdụrụnụ nke mbibi bipolar bụ nkesa nke BPD na mkpụrụ 25,26,27. Atụpụtala ntinye nke "akwa oyi akwa na-agba ume" n'etiti oyi akwa na-ebugharị na mkpụrụ osisi ka ọ bụrụ usoro dị irè maka igbochi mgbasawanye BPD na substrate28, 29, 30, 31. Nke a oyi akwa na-abawanye ohere nke ọnụọgụ electron-oghere recombination na nke ọzọ. oyi akwa epitaxial na mkpụrụ SiC. Mbelata ọnụọgụ abụọ nke oghere eletrọn na-ebelata ike ịkwọ ụgbọala nke REDG ruo BPD n'ime mkpụrụ, yabụ oyi akwa nkwado mejupụtara nwere ike igbochi mmebi bipolar. Ekwesiri iburu n'uche na ntinye nke oyi akwa na-agụnye ụgwọ ndị ọzọ na mmepụta nke wafers, na na-enweghị ntinye nke oyi akwa ọ na-esiri ike ibelata ọnụọgụ ọnụọgụ electron-oghere abụọ site na ịchịkwa naanị njikwa nke onye na-ebu ya n'oge ndụ. Ya mere, a ka nwere mkpa siri ike ịmepụta ụzọ nkwụsị ndị ọzọ iji nweta nguzozi dị mma n'etiti ọnụ ahịa nrụpụta ngwaọrụ na mkpụrụ.
N'ihi na ndọtị nke BPD gaa na 1SSF chọrọ mmegharị nke nkwụsịtụ akụkụ (PDs), ịpịnye PD bụ ụzọ dị mma iji gbochie mmebi bipolar. Ọ bụ ezie na a kọwapụtala PD pinning site na adịghị ọcha ígwè, FPDs na 4H-SiC substrates dị n'ebe dị anya karịa 5 μm site na elu nke epitaxial oyi akwa. Na mgbakwunye, ebe ọnụọgụ mgbasa ozi nke ọla ọ bụla dị na SiC dị obere, ọ na-esiri ike adịghị ọcha ọla gbasaa n'ime mkpụrụ34. N'ihi nnukwu atomiki nke ọla, ntinye ion nke ọla na-esikwa ike. N'ụzọ dị iche, n'ihe banyere hydrogen, ihe kachasị mfe, ion (protons) nwere ike ịkụnye n'ime 4H-SiC ruo omimi nke ihe karịrị 10 µm site na iji ngwa ngwa MeV-class. Ya mere, ọ bụrụ na ntinye proton na-emetụta PD pinning, mgbe ahụ enwere ike iji ya gbochie mgbasa BPD na mkpụrụ. Agbanyeghị, ntinye proton nwere ike mebie 4H-SiC wee mee ka arụmọrụ ngwaọrụ belata37,38,39,40.
Iji merie mmebi ngwaọrụ n'ihi ntinye proton, a na-eji ọkụ ọkụ na-ekpo ọkụ na-emezi ihe mebiri emebi, dị ka usoro nkwụsị nke a na-ejikarị eme ihe mgbe a na-etinye ion ion na nhazi ngwaọrụ1, 40, 41, 42. Ọ bụ ezie na secondary ion mass spectrometry (SIMS)43 nwere. kọrọ mgbasa hydrogen n'ihi elu-okpomọkụ annealing, ọ ga-ekwe omume na naanị njupụta nke hydrogen atom nso nso. FD ezughị iji chọpụta pinning nke PR site na iji SIMS. Ya mere, n'ime ọmụmụ ihe a, anyị kụnyere protons n'ime 4H-SiC epitaxial wafers tupu usoro mmepụta ngwaọrụ, gụnyere nnukwu okpomọkụ annealing. Anyị na-eji PiN diodes dị ka ihe owuwu ngwaọrụ nnwale wee mepụta ha na wafers 4H-SiC epitaxial nke etinyere na proton. Anyị hụziri àgwà volt-ampere iji mụọ mmebi nke arụmọrụ ngwaọrụ n'ihi ịgba ọgwụ mgbochi proton. N'ikpeazụ, anyị hụrụ mgbasawanye nke 1SSF na foto electroluminescence (EL) mgbe etinyere voltaji eletrik na diode PiN. N'ikpeazụ, anyị kwadoro mmetụta nke injection proton na nkwụsị nke mgbasawanye 1SSF.
Na fig. Ọgụgụ 1 na-egosi njirimara dị ugbu a-voltaji (CVCs) nke PiN diodes na ọnụ ụlọ okpomọkụ na mpaghara nwere ma na-enweghị ntinye proton tupu pulsed ugbu a. PiN diodes nwere proton injection na-egosi nrụzi dị ka diodes na-enweghị ịgba ọgwụ proton, n'agbanyeghị na njirimara IV na-ekerịta n'etiti diodes. Iji gosi ọdịiche dị n'etiti ọnọdụ injection, anyị kpara nkata voltaji ugboro ugboro na njupụta dị ugbu a nke 2.5 A / cm2 (dakọtara na 100 mA) dị ka ọnụ ọgụgụ nchịkọta akụkọ dị ka egosiri na Figure 2. A na-anọchikwa anya akụkụ ahụ nke na-ekesa nke ọma. site n'ahịrị nwere ntụpọ. ahịrị. Dị ka a na-ahụ site na ọnụ ọgụgụ dị elu nke akụkụ ahụ, nguzogide na-abawanye ntakịrị na proton doses nke 1014 na 1016 cm-2, ebe PiN diode nwere proton dose nke 1012 cm-2 na-egosi ihe fọrọ nke nta ka ọ bụrụ otu àgwà ahụ na-enweghị ntinye proton. . Anyị rụkwara ntinye proton mgbe emechara PiN diodes nke na-egosighi otu electroluminescence n'ihi mmebi nke ntinye proton kpatara dị ka egosiri na Figure S1 dị ka akọwara na ọmụmụ gara aga37,38,39. Ya mere, annealing na 1600 Celsius C mgbe etinyere Al ions bụ usoro dị mkpa iji mepụta ngwaọrụ iji rụọ ọrụ Al acceptor, nke nwere ike imezi mmebi nke proton implantation kpatara, nke na-eme ka CVC dị n'etiti proton PiN diodes na-abụghị nke a na-etinye. . A na-egosipụtakwa ugboro ugboro dị ugbu a na -5 V na Figure S2, ọ nweghị nnukwu ọdịiche dị n'etiti diodes nwere na enweghị ọgwụ proton.
Njirimara Volt-ampere nke PiN diodes nwere ma na-enweghị protons gbara n'ime ụlọ okpomọkụ. Akụkọ ifo na-egosi dose nke protons.
Ugboro voltaji na 2.5 A/cm2 dị ugbu a maka diodes PiN nwere protons injected na ndị anaghị agba ya. Ahịrị nwere ntụpọ dabara na nkesa nkịtị.
Na fig. 3 na-egosi onyonyo EL nke diode PiN nwere njupụta ugbu a nke 25 A/cm2 mgbe voltaji gasịrị. Tupu itinye ibu dị ugbu a pulsed, a hụghị mpaghara gbara ọchịchịrị nke diode, dị ka egosiri na foto 3. C2. Otú ọ dị, dị ka e gosiri na fig. 3a, na diode PiN na-enweghị ntinye proton, a hụrụ ọtụtụ mpaghara gbara ọchịchịrị nwere akụkụ ọkụ ka etinyechara voltaji eletrik. A na-ahụ mpaghara ndị gbara ọchịchịrị dị otú ahụ na foto EL maka 1SSF gbatịrị site na BPD na substrate28,29. Kama nke ahụ, ahụrụ ụfọdụ mmejọ mkpokọ agbatị n'ime PiN diode nwere protons etinyere, dịka egosiri na Fig. 3b–d. Iji X-ray topography, anyị kwadoro ọnụnọ nke PR nke nwere ike ịkwaga site na BPD gaa na mkpụrụ na mpụta nke kọntaktị na PiN diode na-enweghị proton injection (Fig 4: ihe oyiyi a na-ewepụghị electrode n'elu (foto, PR). N'okpuru electrodes adịghị ahụ anya). na foto 1 na 2. Vidiyo S3-S6 nwere na enweghị ogologo ebe gbara ọchịchịrị (ihe oyiyi EL na-agbanwe oge nke PiN diodes na-enweghị proton injection na etinyere na 1014 cm-2) na-egosikwa na Ozi Mgbakwụnye.
Ihe oyiyi EL nke diodes PiN na 25 A / cm2 mgbe awa 2 nke nrụgide eletriki (a) na-enweghị ntinye proton na ntinye nke (b) 1012 cm-2, (c) 1014 cm-2 na (d) 1016 cm-2 protons .
Anyị gbakọọ njupụta nke 1SSF gbasaa site n'ịgbakọ ebe gbara ọchịchịrị na ọnụ na-egbuke egbuke na atọ PiN diodes maka ọnọdụ ọ bụla, dị ka e gosiri na Figure 5. Njupụta nke gbasaa 1SSF na-ebelata na ụba proton dose, na ọbụna na a dose nke 1012 cm-2. Njupụta nke 1SSF gbasaara dị obere karịa na diode PiN etinyeghị ya.
Mmụba njupụta nke diodes SF PiN nwere ma na-enweghị ntinye proton mgbe ejiri ya na-ebugharị ugbu a (steeti ọ bụla gụnyere diode atọ bujuru).
Mbelata oge ndụ nke onye na-ebu ya na-emetụtakwa mkpochapụ mgbasawanye, yana ịgba ọgwụ proton na-ebelata ndụ onye na-ebu ya32,36. Anyị ahụla oge ndụ onye na-ebu ya na akwa epitaxial 60 µm nke nwere protons agbanyere 1014 cm-2. Site na ndụ onye mbụ na-ebu ibu, ọ bụ ezie na ntinye na-ebelata uru na ~ 10%, annealing na-esote na-eweghachi ya na ~ 50%, dị ka egosiri na Fig. S7. Ya mere, oge ndụ onye na-ebu ya, nke belatara n'ihi ntinye proton, na-eweghachite site na ikpo ọkụ dị elu. Ọ bụ ezie na mbelata 50% nke ndụ ụgbọelu na-egbochikwa mgbasawanye nke mmejọ mkpokọ, njirimara I-V, nke na-adaberekarị na ndụ ụgbọelu, na-egosi naanị obere ọdịiche dị n'etiti diodes injected na ndị na-abụghị etinyere. Ya mere, anyị kwenyere na PD anchoring na-ekere òkè na igbochi mgbasawanye 1SSF.
Ọ bụ ezie na SIMS achọpụtaghị hydrogen mgbe ọ gbasasịrị na 1600 ° C, dị ka a kọrọ na ọmụmụ ndị gara aga, anyị hụrụ mmetụta nke ntinye proton na nkwụsị nke mgbasawanye 1SSF, dị ka egosiri na Figure 1 na 4. 3, 4. Ya mere, anyị kwenyere na Atọm hydrogen nwere njupụta dị n'okpuru oke nchọpụta SIMS (2 × 1016 cm-3) ma ọ bụ ntụpọ ntụpọ butere PD ahụ. ntinye. Ekwesiri ighota na anyi ekwenyeghi na mmụba nke nguzogide on-steeti n'ihi elongation nke 1SSF mgbe ibu ibu ugbua. Nke a nwere ike ịbụ n'ihi kọntaktị ohmic na-ezughị okè mere site na iji usoro anyị, nke a ga-ewepụ n'ọdịnihu dị nso.
N'ikpeazụ, anyị mepụtara usoro nkwụsị maka ịgbatị BPD gaa na 1SSF na 4H-SiC PiN diodes site na iji ntinye proton tupu ịmepụta ngwaọrụ. Mbibi nke njirimara I-V n'oge ntinye proton abaghị uru, karịsịa na proton dose nke 1012 cm-2, mana mmetụta nke ịkwụsị mgbasawanye 1SSF dị ịrịba ama. Ọ bụ ezie na n'ime ọmụmụ ihe a, anyị rụpụtara 10 µm thick PiN diodes na proton implantation na omimi nke 10 µm, ọ ka nwere ike ịkwalite ọnọdụ ntinye ma tinye ha n'ịmepụta ụdị ngwaọrụ 4H-SiC ndị ọzọ. Ekwesịrị ịtụle ụgwọ ndị ọzọ maka nrụpụta ngwaọrụ n'oge ntinye proton, mana ha ga-adị ka nke aluminom ion implantation, nke bụ isi usoro nrụpụta maka ngwaọrụ ike 4H-SiC. Ya mere, ntinye proton tupu nhazi ngwaọrụ bụ usoro nwere ike ịmepụta ngwaọrụ bipolar 4H-SiC na-enweghị mmebi.
A na-eji 4-inch n-ụdị 4H-SiC wafer nwere ọkpụrụkpụ epitaxial nke 10 µm yana ntinye ntinye doping nke 1 × 1016 cm-3 dị ka ihe atụ. Tupu ịhazi ngwaọrụ ahụ, a na-akụnye ion H+ n'ime efere ahụ na ike ngwa ngwa nke 0.95 MeV na ụlọ okpomọkụ ruo omimi nke ihe dịka 10 μm n'ogo nkịtị n'elu efere ahụ. N'oge a na-etinye proton, a na-eji ihe nkpuchi na efere, na efere ahụ nwere akụkụ na-enweghị yana proton dose nke 1012, 1014, ma ọ bụ 1016 cm-2. Mgbe ahụ, a na-akụnye Al ions nwere proton doses nke 1020 na 1017 cm-3 n'elu wafer dum na omimi nke 0-0.2 µm na 0.2-0.5 µm site na elu, na-esote ya na 1600 ° C iji mepụta okpu carbon ụdị ap oyi akwa. -ụdị. Mgbe nke ahụ gasịrị, a na-edebe kọntaktị azụ azụ Ni n'akụkụ akụkụ, ebe 2.0 mm × 2.0 mm mbo dị n'akụkụ Ti/Al n'ihu nke kpụrụ site na fotolithography ma debe usoro peel n'akụkụ akụkụ epitaxial. N'ikpeazụ, a na-eme mkpesa kọntaktị na okpomọkụ nke 700 Celsius. Mgbe anyị gbusịrị wafer n'ime ibe, anyị mere njirimara nrụgide na ngwa.
Ahụrụ njirimara I-V nke diodes PiN arụpụtara site na iji ihe nyocha paramita nke HP4155B. Dịka nrụgide eletriki, ewepụtara 10-millisecond pulsed current nke 212.5 A/cm2 maka awa 2 na ugboro nke 10 pulses/sec. Mgbe anyị họọrọ njupụta dị ugbu a ma ọ bụ ugboro ole, anyị ahụghị mgbasawanye 1SSF ọbụlagodi na diode PiN na-enweghị injection proton. N'oge voltaji eletrik etinyere, okpomọkụ nke diode PiN dị gburugburu 70 ° C na-enweghị kpo oku ọkụ, dị ka egosiri na foto S8. Enwetara ihe onyonyo elektrọnik tupu na mgbe nrụgide eletriki gasịrị na njupụta ugbu a nke 25 A/cm2. Synchrotron reflection grazing incidence X-ray topography na-eji monochromatic X-ray beam (λ = 0.15 nm) na Aichi Synchrotron Radiation Center, ag vector na BL8S2 bụ -1-128 ma ọ bụ 11-28 (lee ref. 44 maka nkọwa) . ).
A na-ewepụta ugboro voltaji na njupụta dị ugbu a nke 2.5 A/cm2 yana nkeji 0.5 V na fig. 2 dabere na CVC nke steeti ọ bụla nke diode PiN. Site na uru nke nrụgide Vave na ọkọlọtọ ọkọlọtọ σ nke nrụgide ahụ, anyị na-akpapụta usoro nkesa nkịtị n'ụdị ahịrị nwere ntụpọ na Figure 2 site na iji nhata ndị a:
Werner, MR & Fahrner, WR Nyocha na ihe, microsensors, sistemu na ngwaọrụ maka oke okpomọkụ na ngwa gburugburu. Werner, MR & Fahrner, WR Nyocha na ihe, microsensors, sistemu na ngwaọrụ maka oke okpomọkụ na ngwa gburugburu.Werner, MR na Farner, WR nkọwa nke ihe, microsensors, sistemu na ngwaọrụ maka ngwa na elu okpomọkụ na ike gburugburu. Werner, MR & Fahrner, WR. Werner, MR & Fahrner, WR Nyochaa ihe, microsensors, sistemu na ngwaọrụ maka oke okpomọkụ na ngwa gburugburu ebe obibi ọjọọ.Werner, MR na Farner, WR nkọwa nke ihe, microsensors, usoro na ngwaọrụ maka ngwa na elu okpomọkụ na ọnọdụ ọjọọ.IEEE Trans. Igwe eletrọnịkị ụlọ ọrụ. 48, 249–257 (2001).
Kimoto, T. & Cooper, JA Fundamentals nke Silicon Carbide Technology Fundamentals nke Silicon Carbide Technology: Uto, Njirimara, Ngwa na Ngwa Vol. Kimoto, T. & Cooper, JA Fundamentals nke Silicon Carbide Technology Fundamentals nke Silicon Carbide Technology: Uto, Njirimara, Ngwa na Ngwa Vol.Kimoto, T. na Cooper, JA Basics of Silicon Carbide Technology Basics of Silicon Carbide Technology: Uto, Njirimara, Ngwa na Ngwa Vol. Kimoto, T. & Cooper, JA 碳化硅技术基础碳化硅技术基础:增长、表征、设备和应用卷。 Kimoto, T. & Cooper, JA Carbon 化silicon technology base Carbon 化silicon technology base: uto, nkọwa, akụrụngwa na ngwa ngwa.Kimoto, T. na Cooper, J. Basics of Silicon Carbide Technology Basics of Silicon Carbide Technology: Uto, Njirimara, Akụrụngwa na Ngwa Vol.252 (Wiley Singapore Pte Ltd, 2014).
Veliadis, V. Azụmahịa buru ibu nke SiC: Ọnọdụ Quo na ihe mgbochi a ga-emeri. onye nkuzi. sayensị. Nzukọ 1062, 125–130 (2022).
Broughton, J., Smet, V., Tummala, RR & Joshi, YK Nyochaa teknụzụ nkwakọ ngwaahịa thermal maka ngwa eletriki eletrik maka ebumnuche traction. Broughton, J., Smet, V., Tummala, RR & Joshi, YK Nyochaa teknụzụ nkwakọ ngwaahịa thermal maka ngwa eletriki eletrik maka ebumnuche traction.Broughton, J., Smet, V., Tummala, RR na Joshi, YK Nleba anya nke teknụzụ nkwakọ ngwaahịa thermal maka ngwa eletriki eletrik maka ebumnuche traction. Broughton, J., Smet, V., Tummala, RR & Joshi, YK 用于牵引目的汽车电力电子热封装技术的回顾。 Broughton, J., Smet, V., Tummala, RR & Joshi, YKBroughton, J., Smet, V., Tummala, RR na Joshi, YK Nleba anya nke teknụzụ nkwakọ ngwaahịa thermal maka ngwa eletriki eletrik maka ebumnuche traction.J. Eletrọn. ngwugwu. trance. ASME 140, 1-11 (2018).
Sato, K., Kato, H. & Fukushima, T. Mmepe nke SiC etinyere usoro traction maka ọgbọ na-esote Shinkansen ụgbọ oloko dị elu. Sato, K., Kato, H. & Fukushima, T. Mmepe nke SiC etinyere usoro traction maka ọgbọ na-esote Shinkansen ụgbọ oloko dị elu.Sato K., Kato H. na Fukushima T. Mmepe nke usoro traction SiC etinyere maka ọgbọ na-abịa ọsọ ọsọ Shinkansen ụgbọ oloko.Sato K., Kato H. na Fukushima T. Traction System Development maka ngwa SiC maka ụgbọ oloko Shinkansen dị elu nke ọgbọ na-abịa. Ihe mgbakwunye IEEJ J. Ind. 9, 453–459 (2020).
Senzaki, J., Hayashi, S., Yonezawa, Y. & Okumura, H. Ihe ịma aka iji nweta ngwaọrụ ike SiC a pụrụ ịdabere na ya nke ukwuu: Site na ọnọdụ dị ugbu a na okwu nke SiC wafers. Senzaki, J., Hayashi, S., Yonezawa, Y. & Okumura, H. Ihe ịma aka iji nweta ngwaọrụ ike SiC a pụrụ ịdabere na ya nke ukwuu: Site na ọnọdụ dị ugbu a na okwu nke SiC wafers.Senzaki, J., Hayashi, S., Yonezawa, Y. na Okumura, H. Nsogbu na mmejuputa ngwaọrụ SiC ike a pụrụ ịdabere na ya: malite na ọnọdụ dị ugbu a na nsogbu nke wafer SiC. Senzaki, J., Hayashi, S., Yonezawa, Y. & Okumura, H. Senzaki, J., Hayashi, S., Yonezawa, Y. & Okumura, H. Ihe ịma aka nke inweta ntụkwasị obi dị elu na ngwaọrụ ike SiC: site na SiC 晶圆的电视和问题设计。Senzaki J, Hayashi S, Yonezawa Y. na Okumura H. Ihe ịma aka na mmepe nke ngwa ike dị elu nke dabeere na silicon carbide: nyochaa ọnọdụ na nsogbu ndị metụtara silicon carbide wafers.Na 2018 IEEE International Symposium on Reliability Physics (IRPS). (Senzaki, J. et al. eds.) 3B.3-1-3B.3-6 (IEEE, 2018).
Kim, D. & Sung, W. Emelitere mkpirisi okirikiri dị mkpụmkpụ maka 1.2kV 4H-SiC MOSFET site na iji P-ọma mejuputara site na ntinye ọwa. Kim, D. & Sung, W. Emelitere mkpirisi okirikiri dị mkpụmkpụ maka 1.2kV 4H-SiC MOSFET site na iji P-ọma mejuputara site na ntinye ọwa.Kim, D. na Sung, V. Mmeziwanye mgbochi mgbochi mkpụmkpụ maka 1.2 kV 4H-SiC MOSFET na-eji P-ọma miri emi emejuputa ya site na ntinye ọwa. Kim, D. & Sung, W. 使用通过沟道注入实现的深P 阱提高了1.2kV 4H-SiC MOSFET 的短路耐用性。 Kim, D. & Sung, W.P 阱提高了1.2kV 4H-SiC MOSFETKim, D. na Sung, V. Mmeziwanye ntachi obi dị mkpirikpi nke 1.2 kV 4H-SiC MOSFET na-eji P-wells miri emi site na ntinye ọwa.Ngwa eletrọnịkị nke IEEE Lett. 42, 1822–1825 (2021).
Skowronski M. et al. Nrụgharị mmezi-emezigharị nke ntụpọ na diodes 4H-SiC pn na-aga n'ihu. J. Ngwa. physics. 92, 4699–4704 (2002).
Ha, S., Mieszkowski, P., Skowronski, M. & Rowland, LB mgbanwe mgbanwe na 4H silicon carbide epitaxy. Ha, S., Mieszkowski, P., Skowronski, M. & Rowland, LB mgbanwe mgbanwe na 4H silicon carbide epitaxy.Ha S., Meszkowski P., Skowronski M. na Rowland LB mgbanwe mgbanwe n'oge 4H silicon carbide epitaxy. Ha, S., Mieszkowski, P., Skowronski, M. & Rowland, LB 4H 碳化硅外延中的位错转换。 Ha, S., Mieszkowski, P., Skowronski, M. & Rowland, LB 4H Ha, S., Meszkowski, P., Skowronski, M. & Rowland, LBMgbanwe mgbanwe 4H na silicon carbide epitaxy.J. Crystal. Uto 244, 257–266 (2002).
Skowronski, M. & Ha, S. Mmebi nke ngwaọrụ bipolar dabeere na hexagonal silicon-carbide. Skowronski, M. & Ha, S. Mmebi nke ngwaọrụ bipolar dabeere na hexagonal silicon-carbide.Skowronski M. na Ha S. Mmebi nke ngwaọrụ bipolar hexagonal dabere na silicon carbide. Skowronski, M. & Ha, S. 六方碳化硅基双极器件的降解。 Skowronski M. & Ha S.Skowronski M. na Ha S. Mmebi nke ngwaọrụ bipolar hexagonal dabere na silicon carbide.J. Ngwa. physics 99, 011101 (2006).
Agarwal, A., Fatima, H., Haney, S. & Ryu, S.-H. Agarwal, A., Fatima, H., Haney, S. & Ryu, S.-H.Agarwal A., Fatima H., Heini S. na Ryu S.-H. Agarwal, A., Fatima, H., Haney, S. & Ryu, S.-H. Agarwal, A., Fatima, H., Haney, S. & Ryu, S.-H.Agarwal A., Fatima H., Heini S. na Ryu S.-H.Usoro nbibi ọhụrụ maka ike SiC ike MOSFET dị elu. Ngwa eletrọnịkị nke IEEE Lett. 28, 587–589 (2007).
Caldwell. Caldwell.Caldwell. Caldwell, JD, Stahlbush, RE, Ancona, MG, Glembocki, OJ & Hobart, KD 关于4H-SiC 中复合引起的层错运动的驱动力。 Caldwell, JD, Stahlbush, RE, Ancona, MG, Glembocki, OJ & Hobart, KDCaldwell.J. Ngwa. physics. 108, 044503 (2010).
Iijima, A. & Kimoto, T. Eletrọnịkị ike nlereanya maka otu Shockley stacking kpatara nguzobe na 4H-SiC kristal. Iijima, A. & Kimoto, T. Eletrọnịkị ike nlereanya maka otu Shockley stacking kpatara nguzobe na 4H-SiC kristal.Iijima, A. na Kimoto, T. Electron-ike nlereanya nke e guzobere otu ntụpọ nke Shockley mbukota na 4H-SiC kristal. Iijima, A. & Kimoto, T. 4H-SiC 晶体中单Shockley 堆垛层错形成的电子能量模型。 Iijima, A. & Kimoto, T. Eletrọnịkị ike nlereanya nke otu Shockley stacking kpatara nguzobe na 4H-SiC crystal.Iijima, A. na Kimoto, T. Electron-ike nlereanya nke e guzobere otu ntụpọ Shockley mbukota na 4H-SiC kristal.J. Ngwa. physics 126, 105703 (2019).
Iijima, A. & Kimoto, T. Ntụle ọnọdụ dị oke egwu maka mgbasawanye / nkwekọrịta nke mmejọ nke otu Shockley stacking na 4H-SiC PiN diodes. Iijima, A. & Kimoto, T. Ntụle ọnọdụ dị oke egwu maka mgbasawanye / nkwekọrịta nke mmejọ nke otu Shockley stacking na 4H-SiC PiN diodes.Iijima, A. na Kimoto, T. Ntụle nke ọnọdụ dị oke egwu maka mgbasawanye / mkpakọ nke otu Shockley packing ntụpọ na 4H-SiC PiN-diodes. Iijima, A. & Kimoto, T. 估计4H-SiC PiN 二极管中单个Shockley 堆垛层错膨胀/收缩的临界条件。 Iijima, A. & Kimoto, T. Atụmatụ nke otu Shockley stacking oyi akwa mgbasawanye/nkwekọrịta ọnọdụ na 4H-SiC PiN diodes.Iijima, A. na Kimoto, T. Ntụle nke ọnọdụ dị oke egwu maka mgbasawanye / mkpakọ nke otu ntụpọ ngwugwu Shockley na 4H-SiC PiN-diodes.ngwa physics Wright. 116, 092105 (2020).
Mannen, Y., Shimada, K., Asada, K. & Ohtani, N. Quantum well action nlereanya maka nguzobe nke otu Shockley stacking mmejọ na 4H-SiC crystal n'okpuru ọnọdụ na-abụghị nha nhata. Mannen, Y., Shimada, K., Asada, K. & Ohtani, N. Quantum well action nlereanya maka nguzobe nke otu Shockley stacking mmejọ na 4H-SiC crystal n'okpuru ọnọdụ na-abụghị nha nhata.Mannen Y., Shimada K., Asada K., na Otani N. A quantum well nlereanya maka nguzobe nke otu Shockley stacking mmejọ na kristal 4H-SiC n'okpuru ọnọdụ enweghị nguzozi.Mannen Y., Shimada K., Asada K. na Otani N. Quantum ezigbo mmekọrịta ihe nlereanya maka nguzobe nke otu Shockley stacking mmejọ na 4H-SiC kristal n'okpuru enweghị ọnọdụ. J. Ngwa. physics. 125, 085705 (2019).
Galeckas, A., Linnros, J. & Pirouz, P. Mmejọ mkpokọ na-emeghachi omume: Ihe akaebe maka usoro izugbe na SiC hexagonal. Galeckas, A., Linnros, J. & Pirouz, P. Mmejọ mkpokọ na-emeghachi omume: Ihe akaebe maka usoro izugbe na SiC hexagonal.Galeckas, A., Linnros, J. na Pirouz, P. Mmezi nkwakọ ngwaahịa na-emeghachi omume: Ihe akaebe maka usoro a na-ahụkarị na Hexagonal SiC. Galeckas, A., Linnros, J. & Pirouz, P. 复合诱导的堆垛层错:六方SiC 中一般机制的证据。 Galeckas, A., Linnros, J. & Pirouz, P. Ihe akaebe maka usoro izugbe nke oyi akwa induction stacking composite: 六方SiC.Galeckas, A., Linnros, J. na Pirouz, P. Mmezi nkwakọ ngwaahịa na-emeghachi omume: Ihe akaebe maka usoro a na-ahụkarị na Hexagonal SiC.physics Pastor Wright. 96, 025502 (2006).
Ishikawa, Y., Sudo, M., Yao, YZ radiation irradiation.Ishikawa , Y. , M. Sudo , Y.-Z ìhè irradiation.Ishikawa, Y., Sudo M., Y.-Z Psychology.Igbe, Ю., M. Судо, Y.-Z Chem., J. Chem., 123, 225101 (2018).
Kato, M., Katahira, S., Ichikawa, Y., Harada, S. & Kimoto, T. Nleba anya n'ịgbakọ ndị na-ebu ibu na otu Shockley stacking mmejọ na nhụsianya akụkụ na 4H-SiC. Kato, M., Katahira, S., Ichikawa, Y., Harada, S. & Kimoto, T. Nleba anya n'ịgbakọ ndị na-ebu ibu na otu Shockley stacking mmejọ na nhụsianya akụkụ na 4H-SiC.Kato M., Katahira S., Itikawa Y., Harada S. na Kimoto T. Nleba anya nke nrụpụta ụgbọ ala na Single Shockley Packing Defects and Partial Dislocations in 4H-SiC. Kato, M., Katahira, S., Ichikawa, Y., Harada, S. & Kimoto, T. 单Shockley 堆垛层错和4H-SiC 部分位错中载流子复合的跟 Kato, M., Katahira, S., Ichikawa, Y., Harada, S. & Kimoto, T. 单Shockley stacking stacking和4H-SiC partial 位错中载流子去生的可以。Kato M., Katahira S., Itikawa Y., Harada S. na Kimoto T. Nleba anya nke nrụpụta ụgbọ ala na Single Shockley Packing Defects and Partial Dislocations in 4H-SiC.J. Ngwa. physics 124, 095702 (2018).
Kimoto, T. & Watanabe, H. Defect engineering na SiC technology maka nnukwu voltaji ngwaọrụ. Kimoto, T. & Watanabe, H. Defect engineering na SiC technology maka nnukwu voltaji ngwaọrụ.Kimoto, T. na Watanabe, H. Mmepe nke ntụpọ na teknụzụ SiC maka ngwaọrụ ike voltaji dị elu. Kimoto, T. & Watanabe, H. 用于高压功率器件的SiC 技术中的缺陷工程。 Kimoto, T. & Watanabe, H. Defect engineering na SiC technology maka nnukwu voltaji ngwaọrụ.Kimoto, T. na Watanabe, H. Mmepe nke ntụpọ na teknụzụ SiC maka ngwaọrụ ike voltaji dị elu.ngwa physics Express 13, 120101 (2020).
Zhang, Z. & Sudarshan, TS Basal ụgbọ elu dislocation-free epitaxy nke silicon carbide. Zhang, Z. & Sudarshan, TS Basal ụgbọ elu dislocation-free epitaxy nke silicon carbide.Zhang Z. na Sudarshan TS Dislocation-free epitaxy silicon carbide n'ime ụgbọ elu basal. Zhang, Z. & Sudarshan, TS 碳化硅基面无位错外延。 Zhang, Z. & Sudarshan, TSZhang Z. na Sudarshan TS Dislocation na-enweghị epitaxy nke ụgbọ elu basal silicon carbide.nkwupụta. physics. Wright. 87, 151913 (2005).
Zhang Zhang Zhang ZhangZhang Z., Moulton E. na Sudarshan TS Mechanism nke mkpochapụ nke mgbapụ ụgbọ elu na ihe nkiri SiC dị mkpa site na epitaxy na mkpụrụ etched. Zhang, Z., Moulton, E. & Sudarshan, TS 通过在蚀刻衬底上外延消除SiC 薄膜中基面位错的机制。 Zhang, Z., Moulton, E. & Sudarshan, TS Usoro nke mkpochapụ nke SiC mkpa ihe nkiri site na itching nke mkpụrụ.Zhang Z., Moulton E. na Sudarshan TS Mechanism nke mkpochapụ nke mgbapụ ụgbọ elu na ihe nkiri SiC dị gịrịgịrị site na epitaxy na mkpụrụ etched.ngwa physics Wright. 89, 081910 (2006).
Shtalbush RE et al. Nkwụsị itolite na-eduga na mbelata nke mgbapụ ụgbọ elu basal n'oge epitaxy 4H-SiC. nkwupụta. physics. Wright. 94, 041916 (2009).
Zhang, X. & Tsuchida, H. Ntugharị nke basal ụgbọ elu dislocations na threading onu dislocations na 4H-SiC epilayers site elu okpomọkụ annealing. Zhang, X. & Tsuchida, H. Ntugharị nke basal ụgbọ elu dislocations na threading onu dislocations na 4H-SiC epilayers site elu okpomọkụ annealing.Zhang, X. na Tsuchida, H. Mgbanwe nke basal ụgbọ elu dislocations n'ime threading onu dislocations na 4H-SiC epitaxial layers site elu okpomọkụ annealing. Zhang, X. & Tsuchida, H. 通过高温退火将4H-SiC 外延层中的基面位错转化为螺纹刃位错。 Zhang, X. & Tsuchida, H. 通过高温退火将4H-SiCZhang, X. na Tsuchida, H. Mgbanwe nke isi ụgbọ elu dislocations n'ime filament onu dislocations na 4H-SiC epitaxial layers site elu okpomọkụ annealing.J. Ngwa. physics. 111, 123512 (2012).
Song, H. & Sudarshan, TS Basal mgbanwe mgbanwe ụgbọ elu dị nso na epilayer/ substrate interface na uto epitaxial nke 4 ° kwụsịrị-axis 4H-SiC. Song, H. & Sudarshan, TS Basal mgbanwe mgbanwe ụgbọ elu dị nso na epilayer/ substrate interface na uto epitaxial nke 4 ° kwụsịrị-axis 4H-SiC.Song, H. na Sudarshan, TS Mgbanwe nke nkwụsị ụgbọ elu basal dị nso na ntanetị epitaxial Layer / substrate interface n'oge nkwụsị-axis epitaxial uto nke 4H-SiC. Song, H. & Sudarshan, TS 在4° 离轴4H-SiC 外延生长中外延层/衬底界面附近的基底平面位错转换。 Abụ, H. & Sudarshan, TS 在4° 离轴4H-SiC Abụ, H. & Sudarshan, TSNtugharị ntugharị nke mkpụrụ osisi dị nso na oyi akwa epitaxial/oke mkpụrụ n'oge uto epitaxial nke 4H-SiC n'èzí axis 4°.J. Crystal. uto 371, 94–101 (2013).
Konishi, K. et al. N'ebe dị elu ugbu a, mgbasa nke basal ụgbọ elu dislocation stacking mmejọ na 4H-SiC epitaxial layers na-agbanwe ka ọ bụrụ mgbakasị ihu filament. J. Ngwa. physics. 114, 014504 (2013).
Konishi, K. et al. Chepụta akwa epitaxial maka SiC MOSFET nke bipolar na-adịghị emebi emebi site na ịchọpụta saịtị ntule agbatị agbatị na nyocha topographic X-ray na-arụ ọrụ. AIP Advanced 12, 035310 (2022).
Lin, S. et al. Mmetụta nke usoro mgbakasị ụgbọ elu basal na mgbasa nke otu mmejọ ụdị Shockley n'oge ire ere ugbu a nke 4H-SiC pin diodes. Japan. J. Ngwa. physics. 57, 04FR07 (2018).
Tahara, T., et al. A na-eji obere ihe na-ebu obere obere ihe na-ebi ndụ nke nwere nitrogen 4H-SiC epilayers iji gbochie mmejọ mkpokọ na diodes PiN. J. Ngwa. physics. 120, 115101 (2016).
Tahara, T. et al. Ndabere nleba anya nke mbubata nke otu Shockley na-agbakọta mmejọ na diodes 4H-SiC PiN. J. Ngwa. Physics 123, 025707 (2018).
Mae, S., Tawara, T., Tsuchida, H. & Kato, M. Microscopic FCA usoro maka omimi-edozi ihe ogologo ndụ ndụ na SiC. Mae, S., Tawara, T., Tsuchida, H. & Kato, M. Microscopic FCA usoro maka omimi-edozi ihe ogologo ndụ ndụ na SiC.Mei, S., Tawara, T., Tsuchida, H. na Kato, M. FCA Microscopic System for Depth-Resolved Carrier Lifetime Measurements na Silicon Carbide. Mae, S., Tawara, T., Tsuchida, H. & Kato, M. 用于SiC 中深度分辨载流子寿命测量的显微FCA 系统。 Mae, S., Tawara, T., Tsuchida, H. & Kato, M. N'ihi na SiC ọkara-omimi 分辨载流子ngụ oge ndụ 的月微FCA usoro.Mei S., Tawara T., Tsuchida H. na Kato M. Micro-FCA usoro maka omimi-edozi ihe ibu ndụ nha na silicon carbide.Ụlọ ihe ọmụmụ sayensị 924, 269-272 (2018).
Hirayama, T. et al. A tụrụ nkesa omimi nke oge ndụ ihe na-ebu ibu n'ígwé epitaxial 4H-SiC na-enweghị mbibi site na iji mkpebi oge nke nnabata ụgbọelu na-agafe na ọkụ gafere. Banye na sayensị. mita. 91, 123902 (2020).


Oge nzipu: Nov-06-2022